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Information card for entry 2242725
Preview
Coordinates | 2242725.cif |
---|---|
Structure factors | 2242725.hkl |
Original IUCr paper | HTML |
Common name | 2,2'-Thiodibenzoic acid‒triphenylphosphane oxide (1/2) |
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Chemical name | 2-[(2-Carboxyphenyl)sulfanyl]benzoic acid‒(diphenylphosphoryl)benzene (1/2) |
Formula | C50 H40 O6 P2 S |
Calculated formula | C50 H40 O6 P2 S |
SMILES | S(c1ccccc1C(=O)O)c1ccccc1C(=O)O.P(=O)(c1ccccc1)(c1ccccc1)c1ccccc1.P(=O)(c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | A 1:2 co-crystal of 2,2'-thiodibenzoic acid and triphenylphosphane oxide: crystal structure, Hirshfeld surface analysis and computational study |
Authors of publication | Tan, Sang Loon; Tiekink, Edward R. T. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2018 |
Journal volume | 74 |
Journal issue | 12 |
Pages of publication | 1764 - 1771 |
a | 10.7085 ± 0.0001 Å |
b | 41.9751 ± 0.0002 Å |
c | 18.9268 ± 0.0001 Å |
α | 90° |
β | 101.49 ± 0.001° |
γ | 90° |
Cell volume | 8336.92 ± 0.1 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0356 |
Residual factor for significantly intense reflections | 0.0331 |
Weighted residual factors for significantly intense reflections | 0.09 |
Weighted residual factors for all reflections included in the refinement | 0.0921 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.036 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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