Information card for entry 2242752
Chemical name |
2,4,6,11-Tetrakis(4-fluorophenyl)-9-oxa-1,5-diazatricyclo[5.3.1.0^3.8^]undecane |
Formula |
C32 H26 F4 N2 O |
Calculated formula |
C32 H26 F4 N2 O |
SMILES |
Fc1ccc([C@H]2N[C@@H](c3ccc(F)cc3)[C@H]3[C@@H](N4[C@@H]([C@@H]2C3OC4)c2ccc(F)cc2)c2ccc(F)cc2)cc1 |
Title of publication |
Crystal structure and Hirshfeld surface analysis of 2,4,6,11-tetrakis(4-fluorophenyl)-9-oxa-1,5-diazatricyclo[5.3.1.0^3.8^]undecane |
Authors of publication |
Vengatesh, G.; Sundaravadivelu, M.; Swinton Darious, Robert |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2018 |
Journal volume |
74 |
Journal issue |
12 |
Pages of publication |
1867 - 1871 |
a |
13.5712 ± 0.0008 Å |
b |
9.5161 ± 0.0006 Å |
c |
20.1543 ± 0.0013 Å |
α |
90° |
β |
99.357 ± 0.002° |
γ |
90° |
Cell volume |
2568.2 ± 0.3 Å3 |
Cell temperature |
296 ± 2 K |
Ambient diffraction temperature |
296 ± 2 K |
Number of distinct elements |
5 |
Space group number |
14 |
Hermann-Mauguin space group symbol |
P 1 21/n 1 |
Hall space group symbol |
-P 2yn |
Residual factor for all reflections |
0.0624 |
Residual factor for significantly intense reflections |
0.0424 |
Weighted residual factors for significantly intense reflections |
0.0991 |
Weighted residual factors for all reflections included in the refinement |
0.1167 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.076 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/2242752.html