Information card for entry 2242792
Chemical name |
<i>N</i>,<i>N</i>'-[Ethane-1,2-diylbis(oxy)]bis(4-methylbenzenesulfonamide) |
Formula |
C16 H20 N2 O6 S2 |
Calculated formula |
C16 H20 N2 O6 S2 |
SMILES |
S(=O)(=O)(NOCCONS(=O)(=O)c1ccc(cc1)C)c1ccc(cc1)C |
Title of publication |
Crystal structure and Hirshfeld surface analysis of <i>N</i>,<i>N</i>'-[ethane-1,2-diylbis(oxy)]bis(4-methylbenzenesulfonamide) |
Authors of publication |
Meral, Seher; Kansiz, Sevgi; Dege, Necmi; Alaman Agar, Aysen; Tsapyuk, Galyna G. |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2019 |
Journal volume |
75 |
Journal issue |
1 |
Pages of publication |
81 - 85 |
a |
16.3393 ± 0.0018 Å |
b |
13.4977 ± 0.0019 Å |
c |
9.7461 ± 0.0011 Å |
α |
90° |
β |
113.442 ± 0.008° |
γ |
90° |
Cell volume |
1972 ± 0.4 Å3 |
Cell temperature |
296 ± 2 K |
Ambient diffraction temperature |
296 ± 2 K |
Number of distinct elements |
5 |
Space group number |
15 |
Hermann-Mauguin space group symbol |
C 1 2/c 1 |
Hall space group symbol |
-C 2yc |
Residual factor for all reflections |
0.0962 |
Residual factor for significantly intense reflections |
0.0472 |
Weighted residual factors for significantly intense reflections |
0.1003 |
Weighted residual factors for all reflections included in the refinement |
0.1157 |
Goodness-of-fit parameter for all reflections included in the refinement |
0.903 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2242792.html