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Information card for entry 2242828
Preview
Coordinates | 2242828.cif |
---|---|
Structure factors | 2242828.hkl |
Original IUCr paper | HTML |
Chemical name | (<i>E</i>)-1-[2,2-Dichloro-1-(4-nitrophenyl)ethenyl]-2-(4-fluorophenyl)diazene |
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Formula | C14 H8 Cl2 F N3 O2 |
Calculated formula | C14 H8 Cl2 F N3 O2 |
SMILES | ClC(=C(/N=N/c1ccc(F)cc1)c1ccc(N(=O)=O)cc1)Cl |
Title of publication | Crystal structure and Hirshfeld surface analysis of (<i>E</i>)-1-[2,2-dichloro-1-(4-nitrophenyl)ethenyl]-2-(4-fluorophenyl)diazene |
Authors of publication | Atioğlu, Zeliha; Akkurt, Mehmet; Shikhaliyev, Namiq Q.; Suleymanova, Gulnar T.; Bagirova, Khanim N.; Toze, Flavien A. A. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2019 |
Journal volume | 75 |
Journal issue | 2 |
Pages of publication | 237 - 241 |
a | 15.8644 ± 0.0005 Å |
b | 7.2242 ± 0.0002 Å |
c | 12.7595 ± 0.0004 Å |
α | 90° |
β | 97.038 ± 0.002° |
γ | 90° |
Cell volume | 1451.32 ± 0.08 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0401 |
Residual factor for significantly intense reflections | 0.0309 |
Weighted residual factors for significantly intense reflections | 0.0826 |
Weighted residual factors for all reflections included in the refinement | 0.0885 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.045 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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