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Information card for entry 2242851
Preview
Coordinates | 2242851.cif |
---|---|
Structure factors | 2242851.hkl |
Original IUCr paper | HTML |
Chemical name | (<i>Z</i>)-6-[(5-Chloro-2-methoxyanilino)methylidene]-2-hydroxycyclohexa-2,4-dien-1-one |
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Formula | C14 H12 Cl N O3 |
Calculated formula | C14 H12 Cl N O3 |
SMILES | Clc1cc(N/C=C2\C(=O)C(O)=CC=C2)c(OC)cc1 |
Title of publication | Crystal structure and Hirshfeld surface analysis of a Schiff base: (<i>Z</i>)-6-[(5-chloro-2-methoxyanilino)methylidene]-2-hydroxycyclohexa-2,4-dien-1-one |
Authors of publication | Demir Kanmazalp, Sibel; Doĝan, Onur Erman; Taşdemir, Volkan; Dege, Necmi; Aĝar, Erbil; Fritsky, Igor O. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2019 |
Journal volume | 75 |
Journal issue | 3 |
Pages of publication | 362 - 366 |
a | 14.7251 ± 0.0009 Å |
b | 14.4444 ± 0.0009 Å |
c | 6.1698 ± 0.0004 Å |
α | 90° |
β | 98.241 ± 0.005° |
γ | 90° |
Cell volume | 1298.74 ± 0.14 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1536 |
Residual factor for significantly intense reflections | 0.0574 |
Weighted residual factors for significantly intense reflections | 0.0801 |
Weighted residual factors for all reflections included in the refinement | 0.1003 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.901 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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Users of the data should acknowledge the original authors of the
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