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Information card for entry 2242878
Preview
Coordinates | 2242878.cif |
---|---|
Structure factors | 2242878.hkl |
Original IUCr paper | HTML |
Chemical name | (<i>E</i>)-1-(4-Chlorophenyl)-2-[2,2-dichloro-1-(4-fluorophenyl)ethenyl]\ diazene |
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Formula | C14 H8 Cl3 F N2 |
Calculated formula | C14 H8 Cl3 F N2 |
SMILES | ClC(Cl)=C(/N=N/c1ccc(Cl)cc1)c1ccc(F)cc1 |
Title of publication | Crystal structure and Hirshfeld surface analysis of (<i>E</i>)-1-(4-chlorophenyl)-2-[2,2-dichloro-1-(4-fluorophenyl)ethenyl]diazene |
Authors of publication | Shikhaliyev, Namiq Q.; Çelikesir, Sevim Türktekin; Akkurt, Mehmet; Bagirova, Khanim N.; Suleymanova, Gulnar T.; Toze, Flavien A. A. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2019 |
Journal volume | 75 |
Journal issue | 4 |
Pages of publication | 465 - 469 |
a | 3.8617 ± 0.0008 Å |
b | 24.249 ± 0.005 Å |
c | 14.724 ± 0.003 Å |
α | 90° |
β | 94.3 ± 0.03° |
γ | 90° |
Cell volume | 1374.9 ± 0.5 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0563 |
Residual factor for significantly intense reflections | 0.0528 |
Weighted residual factors for significantly intense reflections | 0.1385 |
Weighted residual factors for all reflections included in the refinement | 0.1419 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.054 |
Diffraction radiation wavelength | 0.80246 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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