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Information card for entry 2243067
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Coordinates | 2243067.cif |
---|---|
Structure factors | 2243067.hkl |
Original paper (by DOI) | HTML |
Chemical name | Ethyl (<i>E</i>)-2-cyano-3-(3-methylthiophen-2-yl)acrylate |
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Formula | C11 H11 N O2 S |
Calculated formula | C11 H11 N O2 S |
SMILES | O=C(OCC)/C(=C/c1sccc1C)C#N |
Title of publication | Synthesis, characterization, crystal structure and supramolecularity of ethyl (<i>E</i>)-2-cyano-3-(3-methylthiophen-2-yl)acrylate and a new polymorph of ethyl (<i>E</i>)-2-cyano-3-(thiophen-2-yl)acrylate |
Authors of publication | Al-Refai, Mahmoud; Ali, Basem F.; Said, Ala'a B.; Geyer, Armin; Marsch, Michael; Harms, Klaus |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2019 |
Journal volume | 75 |
Journal issue | 9 |
Pages of publication | 1357 - 1361 |
a | 9.2784 ± 0.0002 Å |
b | 10.7925 ± 0.0003 Å |
c | 11.6696 ± 0.0002 Å |
α | 74.464 ± 0.002° |
β | 74.179 ± 0.002° |
γ | 85.073 ± 0.002° |
Cell volume | 1083.11 ± 0.04 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0441 |
Residual factor for significantly intense reflections | 0.0408 |
Weighted residual factors for significantly intense reflections | 0.1192 |
Weighted residual factors for all reflections included in the refinement | 0.1221 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.104 |
Diffraction radiation wavelength | 1.54186 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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