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Information card for entry 2243159
Preview
Coordinates | 2243159.cif |
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Structure factors | 2243159.hkl |
Original IUCr paper | HTML |
Chemical name | 2,2'-{(1<i>E</i>,1'<i>E</i>)-[Ethane-1,2-diylbis(azanylylidene)]bis(methanylylidene)}bis[4-(trifluoromethoxy)phenol]copper(II) hydroquinone hemisolvate |
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Formula | C21 H15 Cu F6 N2 O5 |
Calculated formula | C21 H15 Cu F6 N2 O5 |
Title of publication | Crystal structure and Hirshfeld surface analysis of 2,2'-{(1<i>E</i>,1'<i>E</i>)-[ethane-1,2-diylbis(azanylylidene)]bis(methanylylidene)}bis[4-(trifluoromethoxy)phenol]copper(II) hydroquinone hemisolvate |
Authors of publication | Kansiz, Sevgi; Meral, Seher; Dege, Necmi; Agar, Aysen Alaman; Fritsky, Igor O. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2019 |
Journal volume | 75 |
Journal issue | 11 |
Pages of publication | 1729 - 1733 |
a | 9.3167 ± 0.001 Å |
b | 10.0363 ± 0.001 Å |
c | 11.8052 ± 0.0013 Å |
α | 92.633 ± 0.009° |
β | 97.31 ± 0.009° |
γ | 98.67 ± 0.009° |
Cell volume | 1080 ± 0.2 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0944 |
Residual factor for significantly intense reflections | 0.0669 |
Weighted residual factors for significantly intense reflections | 0.1896 |
Weighted residual factors for all reflections included in the refinement | 0.2174 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.08 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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The link is: https://www.crystallography.net/2243159.html
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