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Information card for entry 2243216
Preview
Coordinates | 2243216.cif |
---|---|
Structure factors | 2243216.hkl |
Original IUCr paper | HTML |
Chemical name | (<i>E</i>)-3-(3-Iodophenyl)-1-(4-iodophenyl)prop-2-en-1-one |
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Formula | C15 H10 I2 O |
Calculated formula | C15 H10 I2 O |
SMILES | c1(ccc(cc1)I)C(=O)/C=C/c1cc(ccc1)I |
Title of publication | Crystal structure and Hirshfeld surface analysis of (<i>E</i>)-3-(3-iodophenyl)-1-(4-iodophenyl)prop-2-en-1-one |
Authors of publication | Spruce, Kieran J.; Hall, Charlie L.; Potticary, Jason; Pridmore, Natalie E.; Cremeens, Matthew E.; D'ambruoso, Gemma D.; Matsumoto, Masaomi; Warren, Gabrielle I.; Warren, Stephen D.; Hall, Simon R. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2020 |
Journal volume | 76 |
Journal issue | 1 |
Pages of publication | 72 - 76 |
a | 7.265 ± 0.0007 Å |
b | 32.864 ± 0.003 Å |
c | 5.8446 ± 0.0006 Å |
α | 90° |
β | 92.277 ± 0.002° |
γ | 90° |
Cell volume | 1394.3 ± 0.2 Å3 |
Cell temperature | 200 K |
Ambient diffraction temperature | 200.01 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0402 |
Residual factor for significantly intense reflections | 0.037 |
Weighted residual factors for significantly intense reflections | 0.0721 |
Weighted residual factors for all reflections included in the refinement | 0.0731 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.273 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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The link is: https://www.crystallography.net/2243216.html
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