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Information card for entry 2243570
Preview
Coordinates | 2243570.cif |
---|---|
Structure factors | 2243570.hkl |
Original IUCr paper | HTML |
Chemical name | (<i>E</i>)-4-Methyl-2-{[(2-methyl-3-nitrophenyl)imino]methyl}phenol |
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Formula | C15 H14 N2 O3 |
Calculated formula | C15 H14 N2 O3 |
SMILES | c1(cc(c(cc1)O)/C=N/c1c(c(ccc1)N(=O)=O)C)C |
Title of publication | Crystal structure, Hirshfeld surface analysis and DFT studies of (<i>E</i>)-4-methyl-2-{[(2-methyl-3-nitrophenyl)imino]methyl}phenol |
Authors of publication | Cinar, Emine Berrin; Faizi, Md. Serajul Haque; Yagci, Nermin Kahveci; Dogan, Onur Erman; Aydin, Alev Sema; Agar, Erbil; Dege, Necmi; Mashrai, Ashraf |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2020 |
Journal volume | 76 |
Journal issue | 10 |
Pages of publication | 1551 - 1556 |
a | 7.3925 ± 0.0003 Å |
b | 15.4082 ± 0.0006 Å |
c | 23.575 ± 0.0009 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2685.31 ± 0.18 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 4 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.0781 |
Residual factor for significantly intense reflections | 0.0427 |
Weighted residual factors for significantly intense reflections | 0.1114 |
Weighted residual factors for all reflections included in the refinement | 0.1248 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.035 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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