Information card for entry 2243570
| Chemical name |
(<i>E</i>)-4-Methyl-2-{[(2-methyl-3-nitrophenyl)imino]methyl}phenol |
| Formula |
C15 H14 N2 O3 |
| Calculated formula |
C15 H14 N2 O3 |
| SMILES |
c1(cc(c(cc1)O)/C=N/c1c(c(ccc1)N(=O)=O)C)C |
| Title of publication |
Crystal structure, Hirshfeld surface analysis and DFT studies of (<i>E</i>)-4-methyl-2-{[(2-methyl-3-nitrophenyl)imino]methyl}phenol |
| Authors of publication |
Cinar, Emine Berrin; Faizi, Md. Serajul Haque; Yagci, Nermin Kahveci; Dogan, Onur Erman; Aydin, Alev Sema; Agar, Erbil; Dege, Necmi; Mashrai, Ashraf |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2020 |
| Journal volume |
76 |
| Journal issue |
10 |
| Pages of publication |
1551 - 1556 |
| a |
7.3925 ± 0.0003 Å |
| b |
15.4082 ± 0.0006 Å |
| c |
23.575 ± 0.0009 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
2685.31 ± 0.18 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
61 |
| Hermann-Mauguin space group symbol |
P b c a |
| Hall space group symbol |
-P 2ac 2ab |
| Residual factor for all reflections |
0.0781 |
| Residual factor for significantly intense reflections |
0.0427 |
| Weighted residual factors for significantly intense reflections |
0.1114 |
| Weighted residual factors for all reflections included in the refinement |
0.1248 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.035 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2243570.html