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Information card for entry 2243755
Preview
Coordinates | 2243755.cif |
---|---|
Structure factors | 2243755.hkl |
Original IUCr paper | HTML |
Chemical name | 3-[(1<i>E</i>)-(4-{4-[(<i>E</i>)-(3-Hydroxybenzylidene)amino]phenoxy}phenylimino)methyl]phenol |
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Formula | C26 H20 N2 O3 |
Calculated formula | C26 H20 N2 O3 |
SMILES | c1(ccc(cc1)/N=C/c1cc(O)ccc1)Oc1ccc(cc1)/N=C/c1cc(O)ccc1 |
Title of publication | Crystal structure and Hirshfeld surface analysis of 3-[(1<i>E</i>)-(4-{4-[(<i>E</i>)-(3-hydroxybenzylidene)amino]phenoxy}phenylimino)methyl]phenol |
Authors of publication | Mohamed, Shaaban K.; Mague, Joel T.; Akkurt, Mehmet; Hawaiz, Farouq E.; Elgarhy, Sahar M. I.; Al-Taifi, Elham A. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2021 |
Journal volume | 77 |
Journal issue | 3 |
Pages of publication | 266 - 269 |
a | 26.8396 ± 0.0006 Å |
b | 5.1174 ± 0.0001 Å |
c | 17.2574 ± 0.0004 Å |
α | 90° |
β | 121.764 ± 0.001° |
γ | 90° |
Cell volume | 2015.27 ± 0.08 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 4 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0347 |
Residual factor for significantly intense reflections | 0.033 |
Weighted residual factors for significantly intense reflections | 0.0842 |
Weighted residual factors for all reflections included in the refinement | 0.086 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.053 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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Users of the data should acknowledge the original authors of the
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