Information card for entry 2243988

Structure parameters

• Chemical name: Bis[μ-<i>N</i>,<i>N</i>-bis(2-aminoethyl)ethane-1,2-diamine]bis[<i>N</i>,<i>N</i>-bis(2-aminoethyl)ethane-1,2-diamine]-μ~4~-oxido-hexa-μ~3~-oxido-octa-μ~2~-oxido-tetraoxidotetranickel(II)hexatantalum(V) nonadecahydrate
• Formula: C24 H110 N16 Ni4 O38 Ta6
• Calculated formula: C24 H92 N16 Ni4 O38 Ta6
• Title of publication: Synthesis and crystal structure of bis[μ-<i>N</i>,<i>N</i>-bis(2-aminoethyl)ethane-1,2-diamine]bis[<i>N</i>,<i>N</i>-bis(2-aminoethyl)ethane-1,2-diamine]-μ~4~-oxido-hexa-μ~3~-oxido-octa-μ~2~-oxido-tetraoxidotetranickel(II)hexatantalum(V) nonadecahydrate
• Authors of publication: Krause, Dana-Céline; Näther, Christian; Bensch, Wolfgang
• Journal of publication: Acta Crystallographica Section E
• Year of publication: 2021
• Journal volume: 77
• Journal issue: 12
• Pages of publication: 1253 - 1257
• a: 10.5033 ± 0.0001 Å
• b: 12.098 ± 0.0002 Å
• c: 13.864 ± 0.0002 Å
• α: 73.748 ± 0.001°
• β: 80.918 ± 0.001°
• γ: 80.842 ± 0.001°
• Cell volume: 1657.75 ± 0.04 ų
• Cell temperature: 100 ± 0.1 K
• Ambient diffraction temperature: 100 ± 0.1 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.023
• Residual factor for significantly intense reflections: 0.0213
• Weighted residual factors for significantly intense reflections: 0.0585
• Weighted residual factors for all reflections included in the refinement: 0.0594
• Goodness-of-fit parameter for all reflections included in the refinement: 1.045
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: Yes