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Information card for entry 2244084
Preview
Coordinates | 2244084.cif |
---|---|
Structure factors | 2244084.hkl |
Original IUCr paper | HTML |
Chemical name | (<i>E</i>)-1-[2,2-Dibromo-1-(4-nitrophenyl)ethenyl]-2-(4-fluorophenyl)diazene |
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Formula | C14 H8 Br2 F N3 O2 |
Calculated formula | C14 H8 Br2 F N3 O2 |
SMILES | BrC(=C(c1ccc(cc1)N(=O)=O)/N=N/c1ccc(cc1)F)Br |
Title of publication | Crystal structure and Hirshfeld surface analysis of (<i>E</i>)-1-[2,2-dibromo-1-(4-nitrophenyl)ethenyl]-2-(4-fluorophenyl)diazene |
Authors of publication | Atioğlu, Zeliha; Akkurt, Mehmet; Shikhaliyev, Namiq Q.; Mammadova, Naila A.; Babayeva, Gulnara V.; Khrustalev, Victor N.; Bhattarai, Ajaya |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2022 |
Journal volume | 78 |
Journal issue | 5 |
Pages of publication | 530 - 535 |
a | 16.0658 ± 0.0002 Å |
b | 7.0329 ± 0.0001 Å |
c | 12.7934 ± 0.0002 Å |
α | 90° |
β | 96.847 ± 0.0006° |
γ | 90° |
Cell volume | 1435.21 ± 0.04 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0377 |
Residual factor for significantly intense reflections | 0.0344 |
Weighted residual factors for significantly intense reflections | 0.0926 |
Weighted residual factors for all reflections included in the refinement | 0.0955 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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