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Information card for entry 2244095
Preview
Coordinates | 2244095.cif |
---|---|
Structure factors | 2244095.hkl |
Original IUCr paper | HTML |
Chemical name | <i>N</i>-{[5-(4-Methylphenyl)-1,2-oxazol-3-yl]methyl}-1-phenyl-<i>N</i>-(prop-2-en-1-yl)methanesulfonamide |
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Formula | C21 H22 N2 O3 S |
Calculated formula | C21 H22 N2 O3 S |
SMILES | S(=O)(=O)(N(Cc1noc(c1)c1ccc(cc1)C)CC=C)Cc1ccccc1 |
Title of publication | Crystal structure and Hirshfeld surface analysis of <i>N</i>-{[5-(4-methylphenyl)-1,2-oxazol-3-yl]methyl}-1-phenyl-<i>N</i>-(prop-2-en-1-yl)methanesulfonamide |
Authors of publication | Khrustalev, Victor N.; Çelikesir, Sevim Türktekin; Akkurt, Mehmet; Kolesnik, Irina A.; Potkin, Vladimir I.; Mlowe, Sixberth |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2022 |
Journal volume | 78 |
Journal issue | 6 |
a | 10.7979 ± 0.0001 Å |
b | 10.2238 ± 0.001 Å |
c | 17.7316 ± 0.0002 Å |
α | 90° |
β | 100.526 ± 0.001° |
γ | 90° |
Cell volume | 1924.55 ± 0.19 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 9 |
Hermann-Mauguin space group symbol | I 1 a 1 |
Hall space group symbol | I -2ya |
Residual factor for all reflections | 0.0452 |
Residual factor for significantly intense reflections | 0.0451 |
Weighted residual factors for significantly intense reflections | 0.1244 |
Weighted residual factors for all reflections included in the refinement | 0.1246 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.094 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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The link is: https://www.crystallography.net/2244095.html
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