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Information card for entry 2244140
Preview
Coordinates | 2244140.cif |
---|---|
Structure factors | 2244140.hkl |
Original IUCr paper | HTML |
Chemical name | (<i>E</i>)-3-[1-(2-Hydroxyphenylanilino)ethylidene]-6-methylpyran-2,4-dione |
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Formula | C14 H13 N O4 |
Calculated formula | C14 H13 N O4 |
SMILES | Oc1c(N/C(C)=C2\C(=O)C=C(OC2=O)C)cccc1 |
Title of publication | Crystal structure, Hirshfeld surface analysis and DFT calculations of (<i>E</i>)-3-[1-(2-hydroxyphenylanilino)ethylidene]-6-methylpyran-2,4-dione |
Authors of publication | Faraj, Imane; Oubella, Ali; Chkirate, Karim; Al Mamari, Khalil; Hökelek, Tuncer; Mague, Joel T.; El Ghayati, Lhoussaine; Sebbar, Nada Kheira; Essassi, El Mokhtar |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2022 |
Journal volume | 78 |
Journal issue | 8 |
Pages of publication | 864 - 870 |
a | 11.6407 ± 0.0004 Å |
b | 7.4412 ± 0.0002 Å |
c | 42.2828 ± 0.0012 Å |
α | 90° |
β | 93.038 ± 0.002° |
γ | 90° |
Cell volume | 3657.42 ± 0.19 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0857 |
Residual factor for significantly intense reflections | 0.0561 |
Weighted residual factors for significantly intense reflections | 0.1282 |
Weighted residual factors for all reflections included in the refinement | 0.146 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.039 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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