Information card for entry 2244240

Structure parameters

• Chemical name: Trimethyl({tris[(phenylsulfanyl)methyl]silyl}methoxy)silane
• Formula: C26 H32 O S3 Si
• Calculated formula: C26 H32 O S3 Si
• Title of publication: Crystal structure of trimeth-yl({tris-[(phenyl-sulfan-yl)meth-yl]sil-yl}meth-oxy)silane and Hirshfeld surface analysis of 3-bromo-2,2-bis-(bromo-meth-yl)propan-1-ol.
• Authors of publication: Wappelhorst, Jan Frederick; Wattenberg, Jonathan; Strohmann, Carsten
• Journal of publication: Acta crystallographica. Section E, Crystallographic communications
• Year of publication: 2023
• Journal volume: 79
• Journal issue: Pt 4
• Pages of publication: 323 - 327
• a: 27.0415 ± 0.0012 Å
• b: 6.9329 ± 0.0003 Å
• c: 27.7963 ± 0.0014 Å
• α: 90°
• β: 96.939 ± 0.002°
• γ: 90°
• Cell volume: 5173 ± 0.4 ų
• Cell temperature: 100 K
• Ambient diffraction temperature: 100 K
• Number of distinct elements: 5
• Space group number: 15
• Hermann-Mauguin space group symbol: C 1 2/c 1
• Hall space group symbol: -C 2yc
• Residual factor for all reflections: 0.0424
• Residual factor for significantly intense reflections: 0.0319
• Weighted residual factors for significantly intense reflections: 0.0711
• Weighted residual factors for all reflections included in the refinement: 0.0773
• Goodness-of-fit parameter for all reflections included in the refinement: 1.031
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: Yes