Evaluation of the Bruker SMART X2S: crystallography for the nonspecialist?
Authors of publication
Eccles, Kevin S.; Stokes, Stephen P.; Daly, Carla A.; Barry, Nicola M.; McSweeney, Sharon P.; O'Neill, Damian J.; Kelly, Dawn M.; Jennings, W. Brian; Ní Dhubhghaill, O. M.; Moynihan, Humphrey A.; Maguire, Anita R.; Lawrence, Simon E.
Journal of publication
Journal of Applied Crystallography
Year of publication
2011
Journal volume
44
Journal issue
1
Pages of publication
213 - 215
a
8.007 ± 0.002 Å
b
16.958 ± 0.005 Å
c
8.031 ± 0.002 Å
α
90°
β
95.097 ± 0.01°
γ
90°
Cell volume
1086.2 ± 0.5 Å3
Cell temperature
300 ± 2 K
Ambient diffraction temperature
300 ± 2 K
Number of distinct elements
4
Space group number
14
Hermann-Mauguin space group symbol
P 1 21/n 1
Hall space group symbol
-P 2yn
Residual factor for all reflections
0.0725
Residual factor for significantly intense reflections
0.0466
Weighted residual factors for significantly intense reflections
0.1257
Weighted residual factors for all reflections included in the refinement
0.1527
Goodness-of-fit parameter for all reflections included in the refinement