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Information card for entry 2300363
Preview
Coordinates | 2300363.cif |
---|---|
Original IUCr paper | HTML |
Formula | C8 H14 N2 O8 |
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Calculated formula | C8 H14 N2 O8 |
SMILES | C1[NH2+]CC[NH2+]C1.OC(=O)C(=O)[O-].C(=O)(C(=O)O)[O-] |
Title of publication | Low-energy contamination of Mo microsource X-ray radiation: analysis and solution of the problem |
Authors of publication | Macchi, Piero; Bürgi, Hans-Beat; Chimpri, Abita S.; Hauser, Jürg; Gál, Zoltán |
Journal of publication | Journal of Applied Crystallography |
Year of publication | 2011 |
Journal volume | 44 |
Journal issue | 4 |
Pages of publication | 763 - 771 |
a | 15.8205 ± 0.00011 Å |
b | 5.68202 ± 0.00003 Å |
c | 12.09246 ± 0.00008 Å |
α | 90° |
β | 107.333 ± 0.0008° |
γ | 90° |
Cell volume | 1037.66 ± 0.012 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.016 |
Residual factor for significantly intense reflections | 0.015 |
Weighted residual factors for all reflections included in the refinement | 0.01 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.452 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2300363.html
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Users of the data should acknowledge the original authors of the
structural data.