Information card for entry 2300388

Structure parameters

• Formula: As0.84 Cu1.08 Mn0.94
• Calculated formula: As0.96 Cu Mn0.86
• Title of publication: Obtaining the structure factors for an epitaxial film using Cu X-ray radiation
• Authors of publication: Wadley, P.; Crespi, A.; Gázquez, J.; Roldán, M.A.; García, P.; Novak, V.; Campion, R.; Jungwirth, T.; Rinaldi, C.; Martí, X.; Holy, V.; Frontera, C.; Rius, J.
• Journal of publication: Journal of Applied Crystallography
• Year of publication: 2013
• Journal volume: 46
• Journal issue: 6
• Pages of publication: 1749 - 1754
• a: 3.82 ± 0.01 Å
• b: 3.82 ± 0.01 Å
• c: 6.318 ± 0.01 Å
• α: 90 ± 0.02°
• β: 90 ± 0.02°
• γ: 90 ± 0.02°
• Cell volume: 92.2 ± 0.4 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 3
• Space group number: 129
• Hermann-Mauguin space group symbol: P 4/n m m :2
• Hall space group symbol: -P 4a 2a
• Residual factor for all reflections: 0.0933
• Residual factor for significantly intense reflections: 0.046
• Weighted residual factors for significantly intense reflections: 0.0679
• Weighted residual factors for all reflections included in the refinement: 0.1066
• Goodness-of-fit parameter for all reflections included in the refinement: 0.391
• Diffraction radiation wavelength: 1.5406 Å
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No