Information card for entry 2300640

Structure parameters

• Formula: O24 Si12
• Calculated formula: O24 Si12
• Title of publication: On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds
• Authors of publication: Wang, Yunchen; Yang, Taimin; Xu, Hongyi; Zou, Xiaodong; Wan, Wei
• Journal of publication: Journal of Applied Crystallography
• Year of publication: 2018
• Journal volume: 51
• Journal issue: 4
• a: 20.022 ± 0.004 Å
• b: 19.899 ± 0.004 Å
• c: 13.383 ± 0.003 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 5332 ± 1.9 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 2
• Space group number: 62
• Hermann-Mauguin space group symbol: P n m a
• Hall space group symbol: -P 2ac 2n
• Residual factor for all reflections: 0.24
• Residual factor for significantly intense reflections: 0.1953
• Weighted residual factors for significantly intense reflections: 0.4677
• Weighted residual factors for all reflections included in the refinement: 0.5078
• Goodness-of-fit parameter for all reflections included in the refinement: 1.132
• Diffraction radiation wavelength: 0.0251 Å
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes