Information card for entry 2300668

Structure parameters

• Formula: O24 Si12
• Calculated formula: O24 Si12
• Title of publication: <i>InsteaDMatic</i>: towards cross-platform automated continuous rotation electron diffraction
• Authors of publication: Roslova, Maria; Smeets, Stef; Wang, Bin; Thersleff, Thomas; Xu, Hongyi; Zou, Xiaodong
• Journal of publication: Journal of Applied Crystallography
• Year of publication: 2020
• Journal volume: 53
• Journal issue: 5
• Pages of publication: 1217 - 1224
• a: 20.022 ± 0.004 Å
• b: 19.899 ± 0.004 Å
• c: 13.383 ± 0.003 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 5332 ± 1.9 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 2
• Space group number: 62
• Hermann-Mauguin space group symbol: P n m a
• Hall space group symbol: -P 2ac 2n
• Residual factor for all reflections: 0.2612
• Residual factor for significantly intense reflections: 0.1992
• Weighted residual factors for significantly intense reflections: 0.5092
• Weighted residual factors for all reflections included in the refinement: 0.5465
• Goodness-of-fit parameter for all reflections included in the refinement: 1.583
• Diffraction radiation wavelength: 0.019 Å
• Diffraction radiation type: 300kVelectrons
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes