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Information card for entry 2311375
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Coordinates | 2311375.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | sodium gallium diarsenate |
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Chemical name | Sodium gallium diarsenate(V) |
Formula | As2 Ga Na O7 |
Calculated formula | As2 Ga Na O7 |
Title of publication | New <i>M</i><sup>+</sup>, <i>M</i><sup>3+</sup>-arsenates - the framework structures of Ag<i>M</i><sup>3+</sup>(HAsO<sub>4</sub>)<sub>2</sub> (<i>M</i><sup>3+</sup> = Al, Ga) and <i>M</i><sup>+</sup>GaAs<sub>2</sub>O<sub>7</sub> (<i>M</i><sup>+</sup> = Na, Ag). |
Authors of publication | Schwendtner, Karolina; Kolitsch, Uwe |
Journal of publication | Acta crystallographica. Section E, Crystallographic communications |
Year of publication | 2017 |
Journal volume | 73 |
Journal issue | Pt 5 |
Pages of publication | 785 - 790 |
a | 6.987 ± 0.001 Å |
b | 8.266 ± 0.002 Å |
c | 9.677 ± 0.002 Å |
α | 90° |
β | 107.5 ± 0.03° |
γ | 90° |
Cell volume | 533 ± 0.2 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0406 |
Residual factor for significantly intense reflections | 0.0325 |
Weighted residual factors for significantly intense reflections | 0.0854 |
Weighted residual factors for all reflections included in the refinement | 0.09 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2311375.html
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