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Information card for entry 2311377
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Coordinates | 2311377.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Dimethylbis(morpholine-4-carbodithioato-κ^2^<i>S</i>,<i>S</i>')tin(IV) |
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Formula | C12 H22 N2 O2 S4 Sn |
Calculated formula | C12 H22 N2 O2 S4 Sn |
SMILES | [Sn]12(SC(=[S]1)N1CCOCC1)(SC(=[S]2)N1CCOCC1)(C)C |
Title of publication | Secondary bonding in di-methyl-bis-(morpholine-4-carbodi-thio-ato-κ<sup>2</sup><i>S</i>,<i>S</i>')tin(IV): crystal structure and Hirshfeld surface analysis. |
Authors of publication | Zaldi, Nordiyana Binti; Hussen, Rusnah Syahila Duali; Lee, See Mun; Halcovitch, Nathan R.; Jotani, Mukesh M.; Tiekink, Edward R. T. |
Journal of publication | Acta crystallographica. Section E, Crystallographic communications |
Year of publication | 2017 |
Journal volume | 73 |
Journal issue | Pt 6 |
Pages of publication | 842 - 848 |
a | 10.1472 ± 0.0001 Å |
b | 13.6653 ± 0.0001 Å |
c | 13.8122 ± 0.0001 Å |
α | 90° |
β | 104.959 ± 0.001° |
γ | 90° |
Cell volume | 1850.36 ± 0.03 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0245 |
Residual factor for significantly intense reflections | 0.024 |
Weighted residual factors for significantly intense reflections | 0.0642 |
Weighted residual factors for all reflections included in the refinement | 0.0645 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.072 |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/2311377.html
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