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Information card for entry 2311580
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Coordinates | 2311580.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | (<i>E</i>)-3-(2-Chloro-4-fluorophenyl)-1-(2,5-dichlorothiophen-3-yl)prop-2-en-1-one |
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Formula | C13 H6 Cl3 F O S |
Calculated formula | C13 H6 Cl3 F O S |
SMILES | Clc1sc(Cl)cc1C(=O)/C=C/c1c(Cl)cc(F)cc1 |
Title of publication | Crystal structure and Hirshfeld surface analysis of (<i>E</i>)-3-(2-chloro-4-fluoro-phen-yl)-1-(2,5-di-chloro-thio-phen-3-yl)prop-2-en-1-one. |
Authors of publication | Sanjeeva Murthy, T. N.; Naveen, S.; Chidan Kumar, C. S.; Veeraiah, M. K.; Quah, Ching Kheng; Siddaraju, B. P.; Warad, Ismail |
Journal of publication | Acta crystallographica. Section E, Crystallographic communications |
Year of publication | 2018 |
Journal volume | 74 |
Journal issue | Pt 8 |
Pages of publication | 1134 - 1137 |
a | 3.9564 ± 0.0008 Å |
b | 13.367 ± 0.002 Å |
c | 25.173 ± 0.005 Å |
α | 90° |
β | 93.363 ± 0.004° |
γ | 90° |
Cell volume | 1329 ± 0.4 Å3 |
Cell temperature | 294 K |
Ambient diffraction temperature | 294 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1109 |
Residual factor for significantly intense reflections | 0.0756 |
Weighted residual factors for significantly intense reflections | 0.1984 |
Weighted residual factors for all reflections included in the refinement | 0.2176 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.036 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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