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Information card for entry 2311703
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Coordinates | 2311703.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Compound_4 |
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Formula | C20 H12 Br2 Se2 |
Calculated formula | C20 H12 Br2 Se2 |
SMILES | [Se](c1cccc2cccc(c12)Br)[Se]c1cccc2cccc(c12)Br |
Title of publication | Nature of E<sub>2</sub>X<sub>2</sub> σ(4c-6e) of the X—E-E—X type at naphthalene 1,8-positions and model, elucidated by X-ray crystallographic analysis and QC calculations with the QTAIM approach. |
Authors of publication | Tsubomoto, Yutaka; Hayashi, Satoko; Nakanishi, Waro; Sasamori, Takahiro; Tokitoh, Norihiro |
Journal of publication | Acta crystallographica Section B, Structural science, crystal engineering and materials |
Year of publication | 2017 |
Journal volume | 73 |
Journal issue | Pt 2 |
Pages of publication | 265 - 275 |
a | 7.8394 ± 0.0001 Å |
b | 8.0986 ± 0.0002 Å |
c | 15.065 ± 0.0004 Å |
α | 90.941 ± 0.001° |
β | 101.888 ± 0.001° |
γ | 111.093 ± 0.001° |
Cell volume | 868.92 ± 0.03 Å3 |
Cell temperature | 103 ± 2 K |
Ambient diffraction temperature | 103 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0432 |
Residual factor for significantly intense reflections | 0.0391 |
Weighted residual factors for significantly intense reflections | 0.0788 |
Weighted residual factors for all reflections included in the refinement | 0.0805 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.198 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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