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Information card for entry 2311785
Preview
Coordinates | 2311785.cif |
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Original paper (by DOI) | HTML |
Formula | Ba2 F2 O12 Si4 Tm2 |
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Calculated formula | Ba2 F2 O12 Si4 Tm2 |
Title of publication | Crystal chemistry and the role of ionic radius in rare earth tetrasilicates: Ba<sub>2</sub>RE<sub>2</sub>Si<sub>4</sub>O<sub>12</sub>F<sub>2</sub> (RE = Er<sup>3+</sup>-Lu<sup>3+</sup>) and Ba<sub>2</sub>RE<sub>2</sub>Si<sub>4</sub>O<sub>13</sub> (RE = La<sup>3+</sup>-Ho<sup>3+</sup>). |
Authors of publication | Fulle, Kyle; Sanjeewa, Liurukara D.; McMillen, Colin D.; Kolis, Joseph W. |
Journal of publication | Acta crystallographica Section B, Structural science, crystal engineering and materials |
Year of publication | 2017 |
Journal volume | 73 |
Journal issue | Pt 5 |
Pages of publication | 907 - 915 |
a | 5.4609 ± 0.0004 Å |
b | 7.1258 ± 0.0005 Å |
c | 8.9379 ± 0.0007 Å |
α | 107.809 ± 0.002° |
β | 101.987 ± 0.002° |
γ | 92.866 ± 0.002° |
Cell volume | 321.5 ± 0.04 Å3 |
Cell temperature | 300 ± 2 K |
Ambient diffraction temperature | 300 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0228 |
Residual factor for significantly intense reflections | 0.0224 |
Weighted residual factors for significantly intense reflections | 0.0623 |
Weighted residual factors for all reflections included in the refinement | 0.0625 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.141 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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