Accurate atomic displacement parameters from time-of-flight neutron-diffraction data at TOPAZ
Authors of publication
Jørgensen, Mads R. V.; Hathwar, Venkatesha R.; Sist, Mattia; Wang, Xiaoping; Hoffmann, Christina M.; Briseno, Alejandro L.; Overgaard, Jacob; Iversen, Bo B.
Journal of publication
Acta Crystallographica Section A Foundations and Advances
Year of publication
2014
Journal volume
70
Journal issue
6
Pages of publication
679
a
26.8106 ± 0.0003 Å
b
7.1602 ± 0.0001 Å
c
14.2029 ± 0.0001 Å
α
90°
β
90°
γ
90°
Cell volume
2726.52 ± 0.05 Å3
Cell temperature
100 ± 2 K
Ambient diffraction temperature
100 ± 2 K
Number of distinct elements
2
Space group number
64
Hermann-Mauguin space group symbol
C m c e
Hall space group symbol
-C 2ac 2
Residual factor for all reflections
0.041
Residual factor for significantly intense reflections
0.022
Weighted residual factors for all reflections included in the refinement
0.055
Goodness-of-fit parameter for all reflections included in the refinement