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Information card for entry 2312275
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Coordinates | 2312275.cif |
---|---|
Structure factors | 2312275.hkl |
Original IUCr paper | HTML |
Common name | Copper cadmium silicon sulfide |
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Chemical name | Copper cadmium silicon sulfide |
Formula | Cd Cu2 S4 Si |
Calculated formula | Cd Cu2 S4 Si |
Title of publication | Accurate X-ray diffraction data required for proper evaluation of bond valence sums and global instability indexes: redetermination of the crystal structures of diamond-like Cu<sub>2</sub>CdSiS<sub>4</sub> and Cu<sub>2</sub>HgSnS<sub>4</sub> as a case study. |
Authors of publication | Treece, Megan M.; Kelly, Jordan C.; Rosello, Kate E.; Craig, Andrew J.; Aitken, Jennifer A. |
Journal of publication | Acta crystallographica. Section C, Structural chemistry |
Year of publication | 2023 |
Journal volume | 79 |
Journal issue | 9 |
a | 7.60853 ± 0.00011 Å |
b | 6.48071 ± 0.00009 Å |
c | 6.24923 ± 0.0001 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 308.141 ± 0.008 Å3 |
Cell temperature | 296 K |
Ambient diffraction temperature | 296 K |
Number of distinct elements | 4 |
Space group number | 31 |
Hermann-Mauguin space group symbol | P m n 21 |
Hall space group symbol | P 2ac -2 |
Residual factor for all reflections | 0.0221 |
Residual factor for significantly intense reflections | 0.0221 |
Weighted residual factors for significantly intense reflections | 0.047 |
Weighted residual factors for all reflections included in the refinement | 0.047 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.269 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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