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Information card for entry 2312291
Preview
| Coordinates | 2312291.cif |
|---|---|
| Original IUCr paper | HTML |
| Common name | DL-alanine |
|---|---|
| Chemical name | DL-alanine |
| Formula | C3 H7 N O2 |
| Calculated formula | C3 H7 N O2 |
| SMILES | [O-]C(=O)[C@H](C)[NH3+] |
| Title of publication | Optimal estimated standard uncertainties of reflection intensities for kinematical refinement from 3D electron diffraction data |
| Authors of publication | Khouchen, Malak; Klar, Paul Benjamin; Chintakindi, Hrushikesh; Suresh, Ashwin; Palatinus, Lukas |
| Journal of publication | Acta Crystallographica Section A Foundations and Advances |
| Year of publication | 2023 |
| Journal volume | 79 |
| Journal issue | 5 |
| Pages of publication | 427 - 439 |
| a | 5.7733 ± 0.0011 Å |
| b | 5.9524 ± 0.0012 Å |
| c | 12.2465 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 420.85 ± 0.12 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 4 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.1482 |
| Residual factor for significantly intense reflections | 0.1428 |
| Weighted residual factors for significantly intense reflections | 0.3477 |
| Weighted residual factors for all reflections included in the refinement | 0.348 |
| Goodness-of-fit parameter for significantly intense reflections | 9.1441 |
| Goodness-of-fit parameter for all reflections included in the refinement | 8.7578 |
| Diffraction radiation probe | electron |
| Diffraction radiation wavelength | 0.0251 Å |
| Diffraction radiation type | electrons200keV |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2312291.html
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Users of the data should acknowledge the original authors of the
structural data.