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Information card for entry 2312399
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Coordinates | 2312399.cif |
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Original paper (by DOI) | HTML |
Chemical name | (<i>E</i>)-<i>N</i>,<i>N</i>-Diethyl-4-{[(4-methoxyphenyl)imino]methyl}aniline |
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Formula | C18 H22 N2 O |
Calculated formula | C18 H22 N2 O |
Title of publication | (<i>E</i>)-<i>N</i>,<i>N</i>-Diethyl-4-{[(4-meth-oxy-phen-yl)imino]-meth-yl}aniline: crystal structure, Hirshfeld surface analysis and energy framework. |
Authors of publication | Subashini, A.; Kumaravel, R.; Tharmalingam, B.; Ramamurthi, K.; Crochet, Aurélien; Stoeckli-Evans, Helen |
Journal of publication | Acta crystallographica. Section E, Crystallographic communications |
Year of publication | 2024 |
Journal volume | 80 |
Journal issue | Pt 2 |
Pages of publication | 201 - 206 |
a | 8.383 ± 0.0007 Å |
b | 9.2872 ± 0.0007 Å |
c | 11.2981 ± 0.0009 Å |
α | 78.991 ± 0.006° |
β | 71.009 ± 0.006° |
γ | 74.174 ± 0.006° |
Cell volume | 795.14 ± 0.12 Å3 |
Cell temperature | 250 ± 2 K |
Ambient diffraction temperature | 250 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0496 |
Residual factor for significantly intense reflections | 0.0352 |
Weighted residual factors for significantly intense reflections | 0.0924 |
Weighted residual factors for all reflections included in the refinement | 0.0999 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.038 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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