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Information card for entry 2312498
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Coordinates | 2312498.cif |
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Original paper (by DOI) | HTML |
Formula | Ge4 N4 O4 Sn |
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Calculated formula | Ge4 N4 O4 Sn |
Title of publication | Crystal structures of two new high-pressure oxynitrides with composition SnGe<sub>4</sub>N<sub>4</sub>O<sub>4</sub>, from single-crystal electron diffraction. |
Authors of publication | Gollé-Leidreiter, Philipp; Bhat, Shrikant; Wiehl, Leonore; Wen, Qingbo; Kroll, Peter; Ishikawa, Ryo; Etter, Martin; Farla, Robert; Ikuhara, Yuichi; Riedel, Ralf; Kolb, Ute |
Journal of publication | Acta crystallographica Section B, Structural science, crystal engineering and materials |
Year of publication | 2024 |
Journal volume | 80 |
Journal issue | 3 |
a | 5.876 ± 0.003 Å |
b | 5.876 ± 0.003 Å |
c | 9.418 ± 0.005 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 281.6 ± 0.3 Å3 |
Cell temperature | 293 K |
Ambient diffraction temperature | 293 K |
Number of distinct elements | 4 |
Space group number | 186 |
Hermann-Mauguin space group symbol | P 63 m c |
Hall space group symbol | P 6c -2c |
Residual factor for all reflections | 0.1001 |
Residual factor for significantly intense reflections | 0.0942 |
Weighted residual factors for significantly intense reflections | 0.1053 |
Weighted residual factors for all reflections included in the refinement | 0.1064 |
Goodness-of-fit parameter for significantly intense reflections | 3.5927 |
Goodness-of-fit parameter for all reflections included in the refinement | 3.3713 |
Diffraction radiation probe | electron |
Diffraction radiation wavelength | 0.0197 Å |
Diffraction radiation type | electron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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