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Information card for entry 2312698
Preview
Coordinates | 2312698.cif |
---|---|
Structure factors | 2312698.hkl |
Original paper (by DOI) | HTML |
Formula | C5 H16 N2 O4 S2 |
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Calculated formula | C5 H16 N2 O4 S2 |
Title of publication | A contribution to the crystal chemistry and topology of organic thiosulfates: bis(1-methylpiperazinium)·S<sub>2</sub>O<sub>3</sub>·H<sub>2</sub>O versus 1-methylpiperazinediium·S<sub>2</sub>O<sub>3</sub>·3H<sub>2</sub>O. |
Authors of publication | Charkin, Dmitri O.; Banaru, Alexandru M.; Ivanov, Semen A.; Kireev, Vadim E.; Aksenov, Sergey M. |
Journal of publication | Acta crystallographica Section B, Structural science, crystal engineering and materials |
Year of publication | 2024 |
Journal volume | 80 |
Journal issue | 6 |
Pages of publication | 706 - 714 |
a | 6.6308 ± 0.0002 Å |
b | 12.4415 ± 0.0003 Å |
c | 12.6936 ± 0.0003 Å |
α | 90° |
β | 100.074 ± 0.002° |
γ | 90° |
Cell volume | 1031.04 ± 0.05 Å3 |
Cell temperature | 293 K |
Ambient diffraction temperature | 293 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0395 |
Residual factor for significantly intense reflections | 0.0242 |
Weighted residual factors for significantly intense reflections | 0.0237 |
Weighted residual factors for all reflections included in the refinement | 0.0254 |
Goodness-of-fit parameter for significantly intense reflections | 1.24 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.13 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2312698.html
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