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Information card for entry 3500006
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Coordinates | 3500006.cif |
---|
Formula | C30 H54 N14 Ni O3 S |
---|---|
Calculated formula | C30 H48 N14 Ni O3 S |
SMILES | CS(C)=O.C1CC[C@H]2[C@H](C1)[NH2][Ni]13([NH2]2)([NH2][C@@H]2[C@@H]([NH2]3)CCCC2)[NH2][C@@H]2[C@@H]([NH2]1)CCCC2.[O-]c1ccnc2n1ncn2.[O-]c1ccnc2n1ncn2.CS(C)=O.C1CC[C@@H]2[C@@H](C1)[NH2][Ni]13([NH2]2)([NH2][C@H]2[C@H]([NH2]3)CCCC2)[NH2][C@H]2[C@H]([NH2]1)CCCC2.[O-]c1ccnc2n1ncn2.[O-]c1ccnc2n1ncn2 |
Authors of publication | Mohammad Abul Haj; Miguel Quirós; Juan M. Salas |
Journal of publication | Personal communication to COD |
Year of publication | 2011 |
a | 15.37 ± 0.003 Å |
b | 18.304 ± 0.004 Å |
c | 13.372 ± 0.003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3762 ± 1.4 Å3 |
Cell temperature | 295 ± 2 K |
Ambient diffraction temperature | 295 ± 2 K |
Number of distinct elements | 6 |
Space group number | 33 |
Hermann-Mauguin space group symbol | P n a 21 |
Hall space group symbol | P 2c -2n |
Residual factor for all reflections | 0.128 |
Residual factor for significantly intense reflections | 0.0636 |
Weighted residual factors for all reflections | 0.1673 |
Weighted residual factors for significantly intense reflections | 0.1386 |
Goodness-of-fit parameter for all reflections | 1.005 |
Goodness-of-fit parameter for significantly intense reflections | 1.148 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/3500006.html
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Users of the data should acknowledge the original authors of the
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