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Information card for entry 4000000
Preview
| Coordinates | 4000000.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C26 H26 Fe |
|---|---|
| Calculated formula | C26 H26 Fe |
| SMILES | C[c]12[c]3(C)[cH]4[c]5([cH]1[Fe]16782345[cH]2[c]1([cH]7[c]8([c]62C)C)c1ccccc1)c1ccccc1 |
| Title of publication | π-Stacking between Pentafluorophenyl and Phenyl Groups as a Controlling Feature of Intra- and Intermolecular Crystal Structure Motifs in Substituted Ferrocenes. Observation of Unexpected Face-to-Face Stacking between Pentafluorophenyl Rings |
| Authors of publication | Blanchard, Mélanie D.; Hughes, Russell P.; Concolino, Thomas E.; Rheingold, Arnold L. |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2000 |
| Journal volume | 12 |
| Journal issue | 6 |
| Pages of publication | 1604 - 1610 |
| a | 9.6395 ± 0.0002 Å |
| b | 8.0062 ± 0.0002 Å |
| c | 12.7395 ± 0.0002 Å |
| α | 90° |
| β | 97.0381 ± 0.0011° |
| γ | 90° |
| Cell volume | 975.77 ± 0.04 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0656 |
| Residual factor for significantly intense reflections | 0.0534 |
| Weighted residual factors for significantly intense reflections | 0.1714 |
| Weighted residual factors for all reflections included in the refinement | 0.1871 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.484 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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