Information card for entry 4000454

Structure parameters

• Formula: C6.82 H10.82 F2 Ga2 O8 P2
• Calculated formula: C6.824 H10.824 F2 Ga2 O8 P2
• Journal of publication: Chemistry of Materials
• Year of publication: 2004
• a: 4.9587 ± 0.0015 Å
• b: 7.078 ± 0.002 Å
• c: 10.024 ± 0.003 Å
• α: 92.404 ± 0.005°
• β: 92.955 ± 0.005°
• γ: 109.187 ± 0.005°
• Cell volume: 331.19 ± 0.17 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0324
• Residual factor for significantly intense reflections: 0.0281
• Weighted residual factors for significantly intense reflections: 0.0736
• Weighted residual factors for all reflections included in the refinement: 0.0758
• Goodness-of-fit parameter for all reflections included in the refinement: 1.069
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.6889 Å
• Diffraction radiation type: Synchrotron
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No