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Information card for entry 4000984
Preview
| Coordinates | 4000984.cif |
|---|---|
| Original paper (by DOI) | HTML |
| External links | PubChem |
| Common name | C14-BSBS |
|---|---|
| Chemical name | C14-BSBS |
| Formula | C42 H64 Se2 |
| Calculated formula | C42 H64 Se2 |
| SMILES | CCCCCCCCCCCCCCc1ccc2c(c1)[se]c1c2[se]c2c1ccc(c2)CCCCCCCCCCCCCC |
| Title of publication | Solution-Processible Organic Semiconductors Based on Selenophene-Containing Heteroarenes, 2,7-Dialkyl[1]benzoselenopheno[3,2-b][1]benzoselenophenes (Cn-BSBSs): Syntheses, Properties, Molecular Arrangements, and Field-Effect Transistor Characteristics |
| Authors of publication | Izawa, Takafumi; Miyazaki, Eigo; Takimiya, Kazuo |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2009 |
| Journal volume | 21 |
| Journal issue | 5 |
| Pages of publication | 903 |
| a | 5.5648 ± 0.0006 Å |
| b | 7.3316 ± 0.0008 Å |
| c | 45.334 ± 0.004 Å |
| α | 90° |
| β | 93.289 ± 0.003° |
| γ | 90° |
| Cell volume | 1846.5 ± 0.3 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0756 |
| Residual factor for significantly intense reflections | 0.0582 |
| Weighted residual factors for significantly intense reflections | 0.1433 |
| Weighted residual factors for all reflections included in the refinement | 0.1527 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4000984.html
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Users of the data should acknowledge the original authors of the
structural data.