Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4001051
Preview
| Coordinates | 4001051.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C12 H14 Bi Br5 N2 |
|---|---|
| Calculated formula | C12 H14 Bi Br5 N2 |
| SMILES | Br[Bi](Br)(Br)(Br)[Br][Bi](Br)(Br)(Br)(Br)[Br][Bi](Br)(Br)(Br)Br.C[n+]1ccc(c2cc[n+](cc2)C)cc1.C[n+]1ccc(c2cc[n+](cc2)C)cc1.C[n+]1ccc(c2cc[n+](cc2)C)cc1 |
| Title of publication | Thermally Induced Bi(III) Lone Pair Stereoactivity: Ferroelectric Phase Transition and Semiconducting Properties of (MV)BiBr5(MV= methylviologen) |
| Authors of publication | Bi, Wenhua; Leblanc, Nicolas; Mercier, Nicolas; Auban-Senzier, Pascale; Pasquier, Claude |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2009 |
| Journal volume | 21 |
| Journal issue | 18 |
| Pages of publication | 4099 |
| a | 5.845 ± 0.0012 Å |
| b | 16.248 ± 0.003 Å |
| c | 10.318 ± 0.002 Å |
| α | 90° |
| β | 101.12 ± 0.03° |
| γ | 90° |
| Cell volume | 961.5 ± 0.3 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for significantly intense reflections | 0.0421 |
| Weighted residual factors for all reflections included in the refinement | 0.0846 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.116 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4001051.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.