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Information card for entry 4001220
Preview
Coordinates | 4001220.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H38 S Si2 |
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Calculated formula | C31 S1.26 Si2 |
SMILES | CC[Si](C#Cc1c2ccccc2c(c2c1cc1sccc1c2)C#C[Si](CC)(CC)CC)(CC)CC |
Title of publication | Trialkylsilylethynyl-Functionalized Tetraceno[2,3-b]thiophene and Anthra[2,3-b]thiophene Organic Transistors |
Authors of publication | Tang, Ming L.; Reichardt, Anna D.; Siegrist, Theo; Mannsfeld, Stefan C. B.; Bao, Zhenan |
Journal of publication | Chemistry of Materials |
Year of publication | 2008 |
Journal volume | 20 |
Journal issue | 14 |
Pages of publication | 4669 |
a | 11.0096 ± 0.0008 Å |
b | 11.3272 ± 0.0008 Å |
c | 11.9921 ± 0.0012 Å |
α | 90° |
β | 91.079 ± 0.007° |
γ | 90° |
Cell volume | 1495.2 ± 0.2 Å3 |
Cell temperature | 293 K |
Ambient diffraction temperature | 293 K |
Number of distinct elements | 4 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.2832 |
Residual factor for significantly intense reflections | 0.156 |
Weighted residual factors for all reflections | 0.3313 |
Weighted residual factors for significantly intense reflections | 0.2539 |
Weighted residual factors for all reflections included in the refinement | 0.3313 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.3034 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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