Information card for entry 4001222
| Formula |
C38 H48 N2 O2 |
| Calculated formula |
C38 H48 N2 O2 |
| SMILES |
O=C1C(=c2c([n+](c3c2cccc3)CCCCCCCC)C)C([O-])=C1c1c2ccccc2n(c1C)CCCCCCCC |
| Title of publication |
Indolic Squaraines as Two-Photon Absorbing Dyes in the Visible Region: X-ray Structure, Electrochemical, and Nonlinear Optical Characterization |
| Authors of publication |
Beverina, Luca; Crippa, Maurizio; Salice, Patrizio; Ruffo, Riccardo; Ferrante, Camilla; Fortunati, Ilaria; Signorini, Raffaella; Mari, Claudio Maria; Bozio, Renato; Facchetti, Antonio; Pagani, Giorgio A. |
| Journal of publication |
Chemistry of Materials |
| Year of publication |
2008 |
| Journal volume |
20 |
| Journal issue |
10 |
| Pages of publication |
3242 |
| a |
8.6408 ± 0.0008 Å |
| b |
12.9692 ± 0.0013 Å |
| c |
14.3498 ± 0.0014 Å |
| α |
79.901 ± 0.002° |
| β |
79.483 ± 0.002° |
| γ |
83.439 ± 0.002° |
| Cell volume |
1551 ± 0.3 Å3 |
| Cell temperature |
153 ± 2 K |
| Ambient diffraction temperature |
153 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0941 |
| Residual factor for significantly intense reflections |
0.0516 |
| Weighted residual factors for significantly intense reflections |
0.1082 |
| Weighted residual factors for all reflections included in the refinement |
0.124 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.9 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4001222.html