Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4001228
Preview
Coordinates | 4001228.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | bis(eta5-cyclopentadienyl)bis(t-butylselenolato)titanium(IV) |
---|---|
Formula | C18 H28 Se2 Ti |
Calculated formula | C18 H28 Se2 Ti |
SMILES | [cH]12[cH]3[cH]4[cH]5[cH]1[Ti]16782345([cH]2[cH]1[cH]7[cH]8[cH]62)([Se]C(C)(C)C)[Se]C(C)(C)C |
Title of publication | Evaluation of Group 4 Metal Bis-cyclopentadienyl Complexes with Selenolate and Tellurolate Ligands for CVD of ME2Films (E = Se or Te) |
Authors of publication | Hector, Andrew L.; Levason, William; Reid, Gillian; Reid, Stuart D.; Webster, Michael |
Journal of publication | Chemistry of Materials |
Year of publication | 2008 |
Journal volume | 20 |
Journal issue | 15 |
Pages of publication | 5100 |
a | 16.434 ± 0.004 Å |
b | 9.3217 ± 0.0017 Å |
c | 12.668 ± 0.002 Å |
α | 90° |
β | 108.391 ± 0.015° |
γ | 90° |
Cell volume | 1841.5 ± 0.7 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 4 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.2528 |
Residual factor for significantly intense reflections | 0.086 |
Weighted residual factors for significantly intense reflections | 0.178 |
Weighted residual factors for all reflections included in the refinement | 0.2412 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.004 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4001228.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.