Information card for entry 4001486

Structure parameters

• Formula: C38 H22 Ga I4 N6 S16
• Calculated formula: C38 H22 Ga I4 N6 S16
• SMILES: IC1=C(I)SC(=C2SC3=C(S2)SCCS3)S1.IC1=C(I)SC(=C2SC3=C(S2)SCCS3)S1.S=C=N[Ga]([n]1ccc2c(c1)cccc2)([n]1ccc2c(c1)cccc2)(N=C=S)(N=C=S)N=C=S
• Title of publication: Iodine Substituted Tetrathiafulvalene Radical Cation Salts with [M(isoq)2(NCS)4]-Anions where M = CrIII, GaIII: Role of I···S and S···S Contacts on Structural and Magnetic Properties
• Authors of publication: Hervé, Katel; Cador, Olivier; Golhen, Stéphane; Costuas, Karine; Halet, Jean-François; Shirahata, Takashi; Muto, Tsuyoshi; Imakubo, Tatsuro; Miyazaki, Akira; Ouahab, Lahcène
• Journal of publication: Chemistry of Materials
• Year of publication: 2006
• Journal volume: 18
• Journal issue: 3
• Pages of publication: 790
• a: 9.8769 ± 0.0003 Å
• b: 10.3545 ± 0.0003 Å
• c: 13.7442 ± 0.0004 Å
• α: 87.8389 ± 0.0012°
• β: 76.1174 ± 0.0013°
• γ: 80.4897 ± 0.0012°
• Cell volume: 1345.81 ± 0.07 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0525
• Residual factor for significantly intense reflections: 0.0384
• Weighted residual factors for significantly intense reflections: 0.0959
• Weighted residual factors for all reflections included in the refinement: 0.1071
• Goodness-of-fit parameter for all reflections included in the refinement: 1.063
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No