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Information card for entry 4001642
Preview
Coordinates | 4001642.cif |
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Original paper (by DOI) | HTML |
Common name | Copper Hexadecafluorophthalocyanine |
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Chemical name | (29F,31F-phthalocyaninato(2-)-N29,N30,N31,N32)copper |
Formula | C32 Cu F16 N8 |
Calculated formula | C32 Cu F16 N8 |
SMILES | [Cu]123[n]4c5=Nc6n1c(c1c6c(F)c(F)c(F)c1F)N=c1c6c(F)c(F)c(F)c(F)c6c([n]21)N=c1n3c(c2c1c(F)c(F)c(F)c2F)=Nc4c1c(F)c(F)c(F)c(F)c51 |
Title of publication | Resolving the Nanoscale Morphology and Crystallographic Structure of Molecular Thin Films: F16CuPc on Graphene Oxide |
Authors of publication | Pandey, Priyanka A.; Rochford, Luke A.; Keeble, Dean S.; Rourke, Jonathan P.; Jones, Tim S.; Beanland, Richard; Wilson, Neil R. |
Journal of publication | Chemistry of Materials |
Year of publication | 2012 |
Journal volume | 24 |
Journal issue | 7 |
Pages of publication | 1365 |
a | 4.86 ± 0.03 Å |
b | 10.22 ± 0.04 Å |
c | 14.8 ± 0.08 Å |
α | 74.14 ± 0.15° |
β | 87.14 ± 0.11° |
γ | 80.75 ± 0.15° |
Cell volume | 698 ± 6 Å3 |
Cell temperature | 120 K |
Ambient diffraction temperature | 120 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1999 |
Residual factor for significantly intense reflections | 0.1238 |
Weighted residual factors for significantly intense reflections | 0.2882 |
Weighted residual factors for all reflections included in the refinement | 0.367 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.007 |
Diffraction radiation wavelength | 0.6889 Å |
Diffraction radiation type | Synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4001642.html
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