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Information card for entry 4001645
Preview
Coordinates | 4001645.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C66 H72 N2 O2 S6 |
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Calculated formula | C66 H72 N2 O2 S6 |
SMILES | CCCCCCN1C(=O)C2C(=C1c1ccc(cc1)c1ccc(s1)c1ccc(s1)c1ccc(s1)CCCCCC)C(=O)N(C=2c1ccc(cc1)c1ccc(s1)c1ccc(s1)c1ccc(s1)CCCCCC)CCCCCC |
Title of publication | Influence of Structural Variation on the Solid-State Properties of Diketopyrrolopyrrole-Based Oligophenylenethiophenes: Single-Crystal Structures, Thermal Properties, Optical Bandgaps, Energy Levels, Film Morphology, and Hole Mobility |
Authors of publication | Kim, Chunki; Liu, Jianhua; Lin, Jason; Tamayo, Arnold B.; Walker, Bright; Wu, Guang; Nguyen, Thuc-Quyen |
Journal of publication | Chemistry of Materials |
Year of publication | 2012 |
Journal volume | 24 |
Journal issue | 10 |
Pages of publication | 1699 |
a | 19.4619 ± 0.0018 Å |
b | 15.099 ± 0.0013 Å |
c | 9.847 ± 0.0007 Å |
α | 90° |
β | 96.944 ± 0.006° |
γ | 90° |
Cell volume | 2872.4 ± 0.4 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1517 |
Residual factor for significantly intense reflections | 0.0657 |
Weighted residual factors for significantly intense reflections | 0.1519 |
Weighted residual factors for all reflections included in the refinement | 0.1979 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.975 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4001645.html
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