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Information card for entry 4001696
Preview
Coordinates | 4001696.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C58.5 H41 B2 Cl Co N6 O6 S4 |
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Calculated formula | C58.5 H41 B2 Cl Co N6 O6 S4 |
SMILES | c1ccc(cc1)C1C(c2ccccc2)=[N]2[Co]3456[N]=1O[B]1(O[N]4=C(C(=[N]5O[B](O2)(O[N]6=C(C(=[N]3O1)c1ccccc1)c1ccccc1)c1ccc(s1)c1cccs1)c1ccccc1)c1ccccc1)c1ccc(s1)c1cccs1.ClCCl |
Title of publication | Charge Injection and Transport in Metal-Containing Conducting Polymers: Spectroelectrochemical Mapping of Redox Activities |
Authors of publication | Liu, Wenjun; Huang, Weijie; Chen, Chun-Hsing; Pink, Maren; Lee, Dongwhan |
Journal of publication | Chemistry of Materials |
Year of publication | 2012 |
Journal volume | 24 |
Journal issue | 18 |
Pages of publication | 3650 |
a | 13.7022 ± 0.0014 Å |
b | 20.271 ± 0.002 Å |
c | 22.131 ± 0.002 Å |
α | 116.461 ± 0.002° |
β | 94.512 ± 0.002° |
γ | 99.807 ± 0.002° |
Cell volume | 5338.8 ± 0.9 Å3 |
Cell temperature | 150 K |
Ambient diffraction temperature | 150 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1526 |
Residual factor for significantly intense reflections | 0.0637 |
Weighted residual factors for all reflections | 0.2793 |
Weighted residual factors for significantly intense reflections | 0.1613 |
Weighted residual factors for all reflections included in the refinement | 0.2793 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.9525 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.