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Information card for entry 4001711
Preview
| Coordinates | 4001711.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | La9.33 O26 Si6 |
|---|---|
| Calculated formula | La9.3336 O26 Si6 |
| Title of publication | Crystal Structure and Oxide-Ion Conductivity alongc-Axis of Apatite-Type Lanthanum Silicate with Excess Oxide Ions |
| Authors of publication | Fukuda, Koichiro; Asaka, Toru; Oyabu, Masayuki; Urushihara, Daisuke; Berghout, Abid; Béchade, Emilie; Masson, Olivier; Julien, Isabelle; Thomas, Philippe |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2012 |
| Journal volume | 24 |
| Journal issue | 23 |
| Pages of publication | 4623 |
| a | 9.721 ± 0.0001 Å |
| b | 9.721 ± 0.0001 Å |
| c | 7.1867 ± 0.0001 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 588.142 ± 0.012 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 3 |
| Space group number | 176 |
| Hermann-Mauguin space group symbol | P 63/m |
| Hall space group symbol | -P 6c |
| Residual factor for all reflections | 0.0145 |
| Residual factor for significantly intense reflections | 0.0126 |
| Weighted residual factors for significantly intense reflections | 0.0186 |
| Weighted residual factors for all reflections included in the refinement | 0.0192 |
| Goodness-of-fit parameter for significantly intense reflections | 1.26 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.24 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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