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Information card for entry 4001711
Preview
Coordinates | 4001711.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | La9.33 O26 Si6 |
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Calculated formula | La9.3336 O26 Si6 |
Title of publication | Crystal Structure and Oxide-Ion Conductivity alongc-Axis of Apatite-Type Lanthanum Silicate with Excess Oxide Ions |
Authors of publication | Fukuda, Koichiro; Asaka, Toru; Oyabu, Masayuki; Urushihara, Daisuke; Berghout, Abid; Béchade, Emilie; Masson, Olivier; Julien, Isabelle; Thomas, Philippe |
Journal of publication | Chemistry of Materials |
Year of publication | 2012 |
Journal volume | 24 |
Journal issue | 23 |
Pages of publication | 4623 |
a | 9.721 ± 0.0001 Å |
b | 9.721 ± 0.0001 Å |
c | 7.1867 ± 0.0001 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 588.142 ± 0.012 Å3 |
Cell temperature | 293 K |
Ambient diffraction temperature | 293 K |
Number of distinct elements | 3 |
Space group number | 176 |
Hermann-Mauguin space group symbol | P 63/m |
Hall space group symbol | -P 6c |
Residual factor for all reflections | 0.0145 |
Residual factor for significantly intense reflections | 0.0126 |
Weighted residual factors for significantly intense reflections | 0.0186 |
Weighted residual factors for all reflections included in the refinement | 0.0192 |
Goodness-of-fit parameter for significantly intense reflections | 1.26 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.24 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4001711.html
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