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Information card for entry 4001773
Preview
Coordinates | 4001773.cif |
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Original paper (by DOI) | HTML |
Chemical name | 1,3-bis(tert-butyltelluro)propane-bis(trichlorogallium(III)) |
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Formula | C11 H24 Cl6 Ga2 Te2 |
Calculated formula | C11 H24 Cl6 Ga2 Te2 |
SMILES | [Te]([Ga](Cl)(Cl)Cl)(C(C)(C)C)CCC[Te]([Ga](Cl)(Cl)Cl)C(C)(C)C |
Title of publication | Telluroether and Selenoether Complexes as Single Source Reagents for Low Pressure Chemical Vapor Deposition of Crystalline Ga2Te3and Ga2Se3Thin Films |
Authors of publication | George, Kathryn; de Groot, C. H. (Kees); Gurnani, Chitra; Hector, Andrew L.; Huang, Ruomeng; Jura, Marek; Levason, William; Reid, Gillian |
Journal of publication | Chemistry of Materials |
Year of publication | 2013 |
Journal volume | 25 |
Journal issue | 9 |
Pages of publication | 1829 |
a | 6.4351 ± 0.0018 Å |
b | 13.119 ± 0.004 Å |
c | 14.261 ± 0.005 Å |
α | 83.81 ± 0.02° |
β | 88.486 ± 0.017° |
γ | 83.745 ± 0.016° |
Cell volume | 1189.7 ± 0.6 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0946 |
Residual factor for significantly intense reflections | 0.0697 |
Weighted residual factors for significantly intense reflections | 0.0983 |
Weighted residual factors for all reflections included in the refinement | 0.1084 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.138 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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