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Information card for entry 4001876
Preview
Jmol._Canvas2D (Jmol) "jmolApplet0"[x]
Coordinates | 4001876.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C49 H111 Cl2 O16 Si4 Yb |
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Calculated formula | C49 H111 Cl2 O16 Si4 Yb |
SMILES | CC(O[Si](O[Yb]1(O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)(O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)[OH][Si]([O]1C(C)(C)C)(OC(C)(C)C)OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)(C)C.ClCCl |
Title of publication | Near-IR Two Photon Microscopy Imaging of Silica Nanoparticles Functionalized with Isolated Sensitized Yb(III) Centers |
Authors of publication | Lapadula, Giuseppe; Bourdolle, Adrien; Allouche, Florian; Conley, Matthew P.; del Rosal, Iker; Maron, Laurent; Lukens, Wayne W.; Guyot, Yannick; Andraud, Chantal; Brasselet, Sophie; Copéret, Christophe; Maury, Olivier; Andersen, Richard A. |
Journal of publication | Chemistry of Materials |
Year of publication | 2014 |
Journal volume | 26 |
Journal issue | 2 |
Pages of publication | 1062 |
a | 13.7858 ± 0.0013 Å |
b | 14.6169 ± 0.0013 Å |
c | 17.5171 ± 0.0016 Å |
α | 97.9411 ± 0.0012° |
β | 91.888 ± 0.0013° |
γ | 99.4943 ± 0.0013° |
Cell volume | 3442.4 ± 0.5 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 6 |
Space group number | 1 |
Hermann-Mauguin space group symbol | P 1 |
Hall space group symbol | P 1 |
Residual factor for all reflections | 0.027 |
Residual factor for significantly intense reflections | 0.024 |
Weighted residual factors for significantly intense reflections | 0.0575 |
Weighted residual factors for all reflections included in the refinement | 0.0596 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.074 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4001876.html
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Users of the data should acknowledge the original authors of the
structural data.