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Information card for entry 4001952
Preview
Coordinates | 4001952.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | 11253b |
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Formula | C44 H32 |
Calculated formula | C44 H32 |
SMILES | c1(c2ccccc2c(c2c(c3ccccc3c(c12)c1ccccc1)c1ccccc1)c1ccc(cc1)C)c1ccc(cc1)C |
Title of publication | Rubrene-Based Single-Crystal Organic Semiconductors: Synthesis, Electronic Structure, and Charge-Transport Properties |
Authors of publication | McGarry, Kathryn A.; Xie, Wei; Sutton, Christopher; Risko, Chad; Wu, Yanfei; Young, Victor G.; Brédas, Jean-Luc; Frisbie, C. Daniel; Douglas, Christopher J. |
Journal of publication | Chemistry of Materials |
Year of publication | 2013 |
Journal volume | 25 |
Journal issue | 11 |
Pages of publication | 2254 |
a | 15.2045 ± 0.0008 Å |
b | 13.901 ± 0.0008 Å |
c | 14.3104 ± 0.0008 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3024.6 ± 0.3 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 2 |
Space group number | 33 |
Hermann-Mauguin space group symbol | P n a 21 |
Hall space group symbol | P 2c -2n |
Residual factor for all reflections | 0.0635 |
Residual factor for significantly intense reflections | 0.0421 |
Weighted residual factors for significantly intense reflections | 0.0861 |
Weighted residual factors for all reflections included in the refinement | 0.0964 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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