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Information card for entry 4001954
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Coordinates | 4001954.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | 11008a |
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Formula | C48 H34 F6 |
Calculated formula | C48 H34 F6 |
SMILES | Cc1cc(C)cc(c1)c1c2c(c3ccc(cc3)C(F)(F)F)c3ccccc3c(c2c(c2c1cccc2)c1cc(C)cc(c1)C)c1ccc(cc1)C(F)(F)F |
Title of publication | Rubrene-Based Single-Crystal Organic Semiconductors: Synthesis, Electronic Structure, and Charge-Transport Properties |
Authors of publication | McGarry, Kathryn A.; Xie, Wei; Sutton, Christopher; Risko, Chad; Wu, Yanfei; Young, Victor G.; Brédas, Jean-Luc; Frisbie, C. Daniel; Douglas, Christopher J. |
Journal of publication | Chemistry of Materials |
Year of publication | 2013 |
Journal volume | 25 |
Journal issue | 11 |
Pages of publication | 2254 |
a | 7.5317 ± 0.001 Å |
b | 14.634 ± 0.002 Å |
c | 32.424 ± 0.004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3573.7 ± 0.8 Å3 |
Cell temperature | 123 ± 2 K |
Ambient diffraction temperature | 123 ± 2 K |
Number of distinct elements | 3 |
Space group number | 57 |
Hermann-Mauguin space group symbol | P b c m |
Hall space group symbol | -P 2c 2b |
Residual factor for all reflections | 0.0976 |
Residual factor for significantly intense reflections | 0.0761 |
Weighted residual factors for significantly intense reflections | 0.2043 |
Weighted residual factors for all reflections included in the refinement | 0.2221 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.057 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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