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Information card for entry 4001960
Preview
Coordinates | 4001960.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C72 H54 Cl6 N2 O8 |
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Calculated formula | C72 H54 Cl6 N2 O8 |
SMILES | O=C1N(C(=O)c2c1c(c1c(c2c2ccc(OC)cc2)c2cccc3cccc1c23)c1ccc(OC)cc1)CCCCCCN1C(=O)c2c(c3c(c(c2C1=O)c1ccc(OC)cc1)c1cccc2cccc3c12)c1ccc(OC)cc1.ClC(Cl)Cl.ClC(Cl)Cl |
Title of publication | Alkylene-Chain Effect on Microwire Growth and Crystal Packing of π-Moieties |
Authors of publication | Ding, Lin; Li, Hai-Bin; Lei, Ting; Ying, Han-Ze; Wang, Rui-Bo; Zhou, Yan; Su, Zhong-Min; Pei, Jian |
Journal of publication | Chemistry of Materials |
Year of publication | 2012 |
Journal volume | 24 |
Journal issue | 10 |
Pages of publication | 1944 |
a | 12.255 ± 0.003 Å |
b | 14.877 ± 0.003 Å |
c | 16.037 ± 0.003 Å |
α | 90.02 ± 0.03° |
β | 94.3 ± 0.03° |
γ | 94.75 ± 0.03° |
Cell volume | 2905.5 ± 1.1 Å3 |
Cell temperature | 113 ± 2 K |
Ambient diffraction temperature | 113 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.081 |
Residual factor for significantly intense reflections | 0.0578 |
Weighted residual factors for significantly intense reflections | 0.1508 |
Weighted residual factors for all reflections included in the refinement | 0.1687 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.045 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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